Transistor Stuck-Open Fault Detection in Multilevel CMOS Circuits
نویسندگان
چکیده
The necessary and sufficient conditions for detecting transistor stuck-open faults in arbitrary multi-level;el CMOS circuits are show. A method for representing a twopattern test for detecting a single stud-open fault using only one cube is presented. The relationship between the D-algorithm and the conditions for detecting transistor stuck-open faults in CMOS circuits is provided. The application of the proposed approach in robust test generation for transistor stuck-open faults in a number of benchmark circuits is demonstrated. The fault coverage achieved is as good as or better than those reported using existing techniques.
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تاریخ انتشار 1999